Nanostructural physical and chemical information derived from the unit cell scattering amplitudes of a spider dragline silk

Polymer

Volumn 46, Issue 14, 2005, Pages 5225-5231

  Trancik, J E ^a,b   Czernuszka, J T ^a   Cockayne, D J H ^a   Viney, C ^a,c  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b Och Spine at New York Presbyterian Hospitals   (United States)

^c Merced   (United States)

Author keywords

Electron diffraction; Silk; Structure factor

Indexed keywords

AMINO ACIDS; ELECTRON DIFFRACTION; POLYMERS; SILK; TRANSMISSION ELECTRON MICROSCOPY;

AMINO ACID SIDE GROUPS; BLACK WIDOW SPIDERS; DIFFRACTION PATTERNS; DIFFRACTION SPOT INTENSITIES;

NANOSTRUCTURED MATERIALS;

ARACHNIDS; ELECTRON DIFFRACTION; POLYMERS; SILK;

SPIDER SILK;

EID: 19944381212     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2005.04.007     Document Type: Article

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