Investigation of the electric field in TiO2/FTO junctions used in dye-sensitized solar cells by photocurrent transients

Journal of Physical Chemistry B

Volumn 109, Issue 19, 2005, Pages 9522-9526

  Rühle, Sven ^a   Dittrich, Thomas ^b  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; DOPING (ADDITIVES); ELECTRIC FIELDS; ELECTROLYTES; FLUORINE; MESOPOROUS MATERIALS; POROUS MATERIALS; PYROLYSIS; SINTERING; TIN COMPOUNDS; TITANIUM DIOXIDE;

ELECTROSTATIC POTENTIAL DISTRIBUTION; F-DOPED SNO2 (FTO) SUBSTRATE; MESOPOROUS FILMS; SPRAY PYROLYSIS;

THIN FILMS;

EID: 19944379485     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp046211y     Document Type: Article

References (23)

1. Schwarzburg, K.; Willig, F. J. Phys. Chem. B 1999, 103, 5743.
2. Schwarzburg, K.; Ernsthofer, R.; Felber, S.; Willig, F. Coord. Chem. Rev. 2004, 248, 1259.
3. Bisquert, J. J. Phys. Chem. B 2003, 107, 13541.
4. Rau, U.; Kron, G.; Werner, J. H. J. Phys. Chem. B 2003, 107, 13547.
5. Kron, G.; Rau, U.; Werner, J. H. J. Phys. Chem. B 2003, 107, 13258.
6. Gregg, B. A. J. Phys. Chem. B 2003, 107, 13540.
7. Pichot, F.; Gregg, B. A. J. Phys. Chem. B 1999, 104, 6.
8. Schlichthörl, G.; Huang, S. Y.; Sprague, J.; Frank, A. J. J. Phys. Chem. B 1997, 101, 8141.
9. Boschloo, G. K.; Goossens, A.; Schoonman, J. J. Electroanal. Chem. 1997, 428, 25.
10. Ferber, J.; Luther, J. J. Phys. Chem. B 2000, 105, 4895.
11. Rühle, S.; Cahen, D. J. Phys. Chem. B 2004, 108, 17946.
12. Nelson, J.; Haque, S. A.; Klug, D. R.; Durrant, J. R. Phys. Rev. B 2001, 63, 205321.
13. Solbrand, A.; Södergren, S.; Lindström, H.; Rensmo, H.; Hagfeldt, A.; Lindquist, S.-E. J. Phys. Chem. B 1997, 101, 2514.
14. Scher, H.; Montroll, E. W. Phys. Rev. B 1975, 12, 2455.
15. Kavan, L.; Grätzel, M. Electrochim. Acta 1995, 40, 643.
16. Cahen, D.; Hodes, G.; Grätzel, M.; Guillemoles, J. F.; Riess, I. J. Phys. Chem. B 2000, 104, 2053.
17. Cameron, P. J.; Peter, L. M. J. Phys. Chem. B 2003, 107, 14394.
18. 2 CB edge, we calculate a band bending of 1 meV. Thus we neglect band bending and draw the bands as straight lines.
19. Gerischer, H. Electrochim. Acta 1989, 34, 1005.
20. Watson, D. F.; Marion, A.; Stux, A. M.; Meyer, G. J. J. Phys. Chem. B 2003, 107, 10971.
21. Bisquert, J.; Garcia-Belmonte, G.; Fabregat-Santiago, F. J. Solid State Electrochem. 1999, 3, 337.
22. Belaidi, A.; Bayón, R.; Dloczik, L.; Ernst, K.; Lux-Steiner, M.-C.; Könenkamp, R. Thin Solid Films 2003, 431, 488.
23. Ernst, K.; Engelhardt, R.; Ellmer, K.; Kelch, C; Muffler, H.-J.; Lux-Steiner, M.-C.; Könenkamp, R. Thin Solid Films 2001, 387, 26.