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Volumn 41, Issue 10, 2005, Pages 590-592
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Isolation charge pump fabricated in silicon on sapphire CMOS technology
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CAPACITORS;
DIELECTRIC PROPERTIES;
DIODES;
DYNAMIC RANDOM ACCESS STORAGE;
ELECTRIC POTENTIAL;
FABRICATION;
MOSFET DEVICES;
OPTICAL PUMPING;
SAPPHIRE;
SILICON ON INSULATOR TECHNOLOGY;
SUBSTRATES;
CHARGE PUMP;
CIRCUIT ARCHITECTURE;
DIELECTRIC COUPLING CAPACITORS;
SILICON ON SAPPHIRE (SOS);
CMOS INTEGRATED CIRCUITS;
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EID: 19944370806
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20050312 Document Type: Article |
Times cited : (8)
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References (7)
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