Refractive index of SrAlF5 and derived grating period for UV/VUV quasi-phase-matching SHG

Journal of Crystal Growth

Volumn 280, Issue 1-2, 2005, Pages 145-150

  Víllora, Encarnación G ^a   Shimamura, Kiyoshi ^a   Muramatsu, Kenichi ^b   Takekawa, Shunji ^a   Kitamura, Kenji ^a   Ichinose, Noboru ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b NIKON CORPORATION   (Japan)

^c WASEDA UNIVERSITY   (Japan)

Author keywords

A2. Czochralski method; B1. Halides; B2. Ferroelectric materials; B3. Nonlinear optical

Indexed keywords

EXCIMER LASERS; FERROELECTRIC MATERIALS; SOLID STATE LASERS; STRONTIUM COMPOUNDS; ULTRAVIOLET RADIATION; VACUUM;

CZOCHRALSKI METHOD; HALIDES; NONLINEAR OPTICAL; QUASI-PHASE-MATCHING;

REFRACTIVE INDEX;

EID: 19944365543     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.03.029     Document Type: Article

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