Raman temperature measurement during photostructural changes in Ge xSe1-x glass

Journal of Non-Crystalline Solids

Volumn 351, Issue 19-20, 2005, Pages 1653-1657

  Schardt, Craig R ^a   Lucas, Pierre ^b   Doraiswamy, Anand ^b   Jivaganont, Pranuda ^b   Simmons, Joseph H ^b  

^a 3M COMPANY   (United States)

^b University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; DIFFERENTIAL SCANNING CALORIMETRY; GERMANIUM COMPOUNDS; HEATING; IRRADIATION; PHOTOCHEMICAL REACTIONS; PHOTONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; RELAXATION PROCESSES; TEMPERATURE MEASUREMENT; THERMAL EFFECTS;

LIGHT INDUCED PHOTODARKENING; PHOTOEXPANSION; PHOTOINDUCED STRUCTURAL CHANGES; RAMAN SIGNAL SCATTERING;

GLASS;

EID: 19944363861     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.04.056     Document Type: Article

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