Annular Sub-aperture Interferometric Testing technique for large aspheric surfaces

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5638, Issue PART 2, 2005, Pages 992-997

  Hou, Xi ^a,b,c   Wu, Fan ^a   Wu, Shi Bin ^a   Chen, Qiang ^a  

^a INSTITUTE OF OPTICS AND ELECTRONICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c Advanced Optical Research Center   (China)

Author keywords

Annular subaperture; Asphere measurement; Large aspheric surface; Stitching

Indexed keywords

ASTRONOMY; COSTS; INTERFEROMETERS; INTERFEROMETRY; LENSES; MATHEMATICAL MODELS; MIRRORS; NATURAL FREQUENCIES; OPTICAL SYSTEMS; SPACE OPTICS; WAVEFRONTS;

ANNULAR SUB-APERTURE INTERFEROMETRIC TESTING (ASIT); ANNULAR SUPAPERTURE; ASPHERE MEASUREMENT; LARGE ASPHERIC SURFACES; STITCHING;

OPTICAL TESTING;

EID: 19844382439     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.570188     Document Type: Conference Paper

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