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Volumn 624, Issue 2 I, 2005, Pages 1010-1024
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Single-visit photometric and obscurational completeness
a
STScI
(United States)
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Author keywords
Instrumentation: high angular resolution; Planetary systems; Techniques: high angular resolution
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Indexed keywords
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EID: 19844375829
PISSN: 0004637X
EISSN: 15384357
Source Type: Journal
DOI: 10.1086/429124 Document Type: Article |
Times cited : (121)
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References (9)
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