Structural characterizations and waveguiding properties of YAG thin films obtained by different sol-gel processes

Optical Materials

Volumn 27, Issue 9, 2005, Pages 1471-1479

  Wu, Y C ^a   Parola, S ^b   Marty, O ^a   Villanueva Ibanez, M ^a   Mugnier, J ^a  

^a UNIVERSITÉ LYON 1   (France)

^b UNIVERSITÉ CLAUDE BERNARD LYON 1   (France)

Author keywords

Crystallization kinetics; Sol gel; Thin films; Waveguide; YAG

Indexed keywords

ANNEALING; CRYSTALLIZATION; DIFFERENTIAL THERMAL ANALYSIS; REFRACTIVE INDEX; SOL-GELS; TRANSMISSION ELECTRON MICROSCOPY; WAVEGUIDES; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPY (CTEM); CRYSTALLIZATION KINETICS; M-LINE SPECTROSCOPY; Y3AL5O12 (YAG) THIN FILMS;

THIN FILMS;

EID: 19844371266     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2005.03.004     Document Type: Conference Paper

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