Influence of preparation technique on the microscopic structure and surface morphology of nanometer TiO2 thin films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5635, Issue , 2005, Pages 390-398

  Hu, Xiaoyun ^a   Fan, Jun ^a   Li, Ting ^a   Zhang, Dekai ^a   Bai, Jintao ^a   Hou, Xun ^a,b  

^a NORTHWEST UNIVERSITY   (China)

^b XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

Author keywords

Microstructure; Nanometer; Preparation technique; Sol gel; Surface morphology; TiO2thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSTRUCTURE; MORPHOLOGY; ORGANOMETALLICS; SOL-GELS; SURFACE PHENOMENA; TEMPERATURE DISTRIBUTION; TITANIUM OXIDES; X RAY DIFFRACTION;

NANOMETER; ORGANIC GROUPS; PREPARATION TECHNIQUE; TIO2 THIN FILMS;

THIN FILMS;

EID: 19844369159     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.575510     Document Type: Conference Paper

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