X-ray high-resolution diffraction using refractive lenses

Applied Physics Letters

Volumn 86, Issue 1, 2005, Pages

  Drakopoulos, Michael ^a   Snigirev, Anatoly ^b   Snigireva, Irina ^b   Schilling, Jörg ^c  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELECTROMAGNETIC WAVE REFRACTION; IMAGING TECHNIQUES; LENSES; POLYCRYSTALLINE MATERIALS; SCANNING; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SYNCHROTRON RADIATION;

MICRODIFFRACTION; MOMENTUM TRANSFER; PHOTONIC CRYSTALS; REFRACTIVE LENSES;

X RAY DIFFRACTION ANALYSIS;

EID: 19744383449     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1843282     Document Type: Article

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