High-q-resolution neutron scattering technique using triple-axis spectrometers

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 60, Issue 6, 2004, Pages 598-603

  Xu, Guangyong ^a   Gehring, P M ^b   Ghosh, V J ^a   Shirane, G ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 19744371577     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767304022652     Document Type: Article

References (15)

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