메뉴 건너뛰기




Volumn 247, Issue 1-4, 2005, Pages 590-601

Laser manipulation of clusters, structural defects and nanoaggregates in barrier structures on silicon and binary semi-conductors

Author keywords

Laser; Schottky barrier; Semi conductors; Structural defects

Indexed keywords

AGGREGATES; CRYSTAL STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; DISLOCATIONS (CRYSTALS); EDGE DETECTION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; LASER BEAM EFFECTS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SINGLE CRYSTALS; SURFACE STRUCTURE; THYRISTORS;

EID: 19744364819     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.01.081     Document Type: Article
Times cited : (9)

References (19)
  • 10
    • 19744364188 scopus 로고
    • Silicides for VLSI Applications
    • Murray Hill New Jersey
    • S.P. Murarka Silicides for VLSI Applications Bell Telephone Laboratories 1983 Murray Hill New Jersey (Mir, Moscow, 1986, p. 121)
    • (1983) Bell Telephone Laboratories
    • Murarka, S.P.1
  • 11
    • 19744368409 scopus 로고
    • P-T-x- of the phase diagram of systems metal - Chalcogen
    • Moscow
    • V.P. Zlomanov, A.V. Novosyiolova, P-T-x- of the Phase Diagram of Systems Metal - Chalcogen, Science, Moscow, 1987, p. 121.
    • (1987) Science , pp. 121
    • Zlomanov, V.P.1    Novosyiolova, A.V.2
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.