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Volumn 247, Issue 1-4, 2005, Pages 590-601
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Laser manipulation of clusters, structural defects and nanoaggregates in barrier structures on silicon and binary semi-conductors
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Author keywords
Laser; Schottky barrier; Semi conductors; Structural defects
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Indexed keywords
AGGREGATES;
CRYSTAL STRUCTURE;
CURRENT VOLTAGE CHARACTERISTICS;
DISLOCATIONS (CRYSTALS);
EDGE DETECTION;
ELECTRIC CURRENTS;
ELECTRIC POTENTIAL;
LASER BEAM EFFECTS;
NANOSTRUCTURED MATERIALS;
SCANNING ELECTRON MICROSCOPY;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING SILICON;
SINGLE CRYSTALS;
SURFACE STRUCTURE;
THYRISTORS;
LASER;
SCHOTTKY BARRIER;
SEMI-CONDUCTORS;
STRUCTURAL DEFECTS;
SEMICONDUCTOR MATERIALS;
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EID: 19744364819
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2005.01.081 Document Type: Article |
Times cited : (9)
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References (19)
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