Ba4Ti12O27: Rietveld refinement using X-ray powder diffraction data

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 1, 1999, Pages 2-4

  Currao, Antonio ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF BERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 19644364860     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198010919     Document Type: Article

References (16)

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