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Volumn , Issue , 2004, Pages 333-337

The influence of a phase change in the measured voltage on flickermeter response

Author keywords

Flickermeter; Power quality; Voltage fluctuation

Indexed keywords

COMPUTER SIMULATION; ELECTRIC DISTORTION; ELECTRIC MEASURING INSTRUMENTS; FREQUENCY RESPONSE; VOLTAGE CONTROL; VOLTAGE MEASUREMENT; WAVEFORM ANALYSIS;

EID: 19644362387     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

References (5)
  • 2
    • 4644248539 scopus 로고    scopus 로고
    • Test Protocol prepared by CCU2-Cigre C4.05/CIRED 2/UIE WG2 Joint Working Group on Power Quality, Draft 8, May
    • IEC Flicker Meter Used in Power System Voltage Monitoring. Test Protocol prepared by CCU2-Cigre C4.05/CIRED 2/UIE WG2 Joint Working Group on Power Quality, Draft 8, May 2003.
    • (2003) IEC Flicker Meter Used in Power System Voltage Monitoring
  • 4
    • 19644388596 scopus 로고    scopus 로고
    • The IEC Flickermeter model
    • AGH-UST
    • Rogóz M., The IEC Flickermeter model, Elektotechnika i Elektronika, AGH-UST, Volume 22, No.1, 2003
    • (2003) Elektotechnika i Elektronika , vol.22 , Issue.1
    • Rogóz, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.