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Volumn 16, Issue 2-3, 2005, Pages 177-182

Gas-oil two-phase flow measurement using an electrical capacitance tomography system and a Venturi meter

Author keywords

Capacitance; Flowrate; Tomography; Two phase flow; Venturi

Indexed keywords

ALGEBRA; ALGORITHMS; CAPACITANCE; IMAGE RECONSTRUCTION; TOMOGRAPHY; TWO PHASE FLOW;

EID: 19544392464     PISSN: 09555986     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.flowmeasinst.2005.02.007     Document Type: Article
Times cited : (92)

References (12)
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  • 4
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    • Murdock, J.W.1
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  • 9
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    • Principles and industrial applications of electrical capacitance tomography
    • M.S. Beck M. Bayars T. Dyakowski Principles and industrial applications of electrical capacitance tomography Measurement & Control 30 7 1997 97-200
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    • Beck, M.S.1    Bayars, M.2    Dyakowski, T.3
  • 10
    • 0037310217 scopus 로고    scopus 로고
    • Application of electrical capacitance tomography to the void fraction measurement of two-phase flow
    • Z. Huang B. Wang H. Li Application of electrical capacitance tomography to the void fraction measurement of two-phase flow IEEE Transactions on Instrumentation and Measurement 52 1 2003 7-12
    • (2003) IEEE Transactions on Instrumentation and Measurement , vol.52 , Issue.1 , pp. 7-12
    • Huang, Z.1    Wang, B.2    Li, H.3
  • 11
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    • A novel capacitance measurement circuit for electrical capacitance tomography
    • 29th-31st August 2001, Hannover, Germany
    • B. Wang, Z. Huang, H. Li, A novel capacitance measurement circuit for electrical capacitance tomography, in: 2nd World Congress on Industrial Process Tomography, 29th-31st August 2001, Hannover, Germany, 2001, pp. 580-585
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    • Wang, B.1    Huang, Z.2    Li, H.3
  • 12
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    • An on-line flow pattern identification system for gas-oil two-phase flow using electrical capacitance tomography
    • 18-20 May 2004, Come, Italy
    • D. Xie, H. Ji, Z. Huang, H. Li, An on-line flow pattern identification system for gas-oil two-phase flow using electrical capacitance tomography, in: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, vol. 3, 18-20 May 2004, Come, Italy, 2004, pp. 2320-2325
    • (2004) Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference , vol.3 , pp. 2320-2325
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.