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Volumn 36, Issue 1, 2004, Pages 39-42
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Comparison of nanometric cutting processes for monocrystalline silicon and aluminum
a a a a |
Author keywords
Amorphous phase transformation; Chip volume; Molecular dynamics (MD); Nanometric cutting
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Indexed keywords
ALUMINUM;
CRYSTALLINE MATERIALS;
MOLECULAR DYNAMICS;
PHASE TRANSITIONS;
POTENTIAL ENERGY;
SILICON;
AMORPHOUS PHASE TRANSFORMATION;
CHIP VOLUME;
MONOCRYSTALLINE ALUMINUM;
MONOCRYSTALLINE SILICON;
MORSE POTENTIAL FUNCTION;
NANOMETRIC CUTTING;
TERSOFF POTENTIAL FUNCTION;
CUTTING;
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EID: 1942539824
PISSN: 03676234
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (5)
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References (6)
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