The information content of the scattered intensity in diffraction tomography

Information Sciences

Volumn 162, Issue 1, 2004, Pages 3-20

  Gbur, Greg ^a   Wolf, Emil ^b,c  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

^b UNIVERSITY OF ROCHESTER   (United States)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; ELECTROMAGNETIC WAVE DIFFRACTION; LIGHT EXTINCTION; LIGHT SCATTERING; PROBLEM SOLVING; X RAYS;

DIFFRACTION TOMOGRAPHY; STRUCTURAL TESTING;

INFORMATION TECHNOLOGY;

EID: 1942536974     PISSN: 00200255     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ins.2003.01.001     Document Type: Article

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