Linear and nonlinear regime of a random resistor network under biased percolation

Computational Materials Science

Volumn 30, Issue 1-2 SPEC ISS., 2004, Pages 120-125

  Pennetta, C ^a   Alfinito, E ^a   Reggiani, L ^a  

^a NATIONAL NANOTECHNOLOGY LABORATORY   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; COMPOSITE MATERIALS; COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; MONTE CARLO METHODS; NETWORKS (CIRCUITS); PERCOLATION (SOLID STATE); PERTURBATION TECHNIQUES; RANDOM PROCESSES;

IRREVERSIBLE BREAKDOWN; OHMIC RESISTANCE; RANDOM RESISTOR NETWORKS (RRN); THERMAL COUPLING;

RESISTORS;

EID: 1942516946     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.commatsci.2004.01.019     Document Type: Conference Paper

References (12)

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