Investigation of charging effects of insulators in scanning electron microscope

Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya

Volumn , Issue 3, 2004, Pages 40-52

  Andrianov, M V ^a   Aristov, V V ^a   Gostev, A V ^a   Rau, E I ^a  

^a NONE

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EID: 1942516796     PISSN: 02073528     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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