Room temperature spectrometry in the MIR range

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5251, Issue , 2004, Pages 89-96

  Passerini, Reynald ^a   Kohli, Markus ^a,b   Ryser, Peter ^a   Seifert, Andreas ^b   Willing, Bert ^b   Cattin, Pierre Yves ^b  

^a EPFL   (Switzerland)

^b IR Microsystems   (Switzerland)

Author keywords

Linear detector; MIR; Spectrometer

Indexed keywords

ACCIDENT PREVENTION; DIFFRACTION GRATINGS; HOLOGRAPHY; OPTICAL FILTERS; OPTICAL RESOLVING POWER; PROCESS CONTROL; PYROELECTRICITY; SIGNAL TO NOISE RATIO; SPECTROMETERS; THIN FILMS;

LINEAR DETECTORS; MIR;

SPECTROMETRY;

EID: 1942510680     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.512953     Document Type: Conference Paper

References (13)

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