High resolution metrology of optical components by spectral interferometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5252, Issue , 2004, Pages 381-390

  Reolon, David ^a   Brun, Gerald ^a   Ben Houcine, Karim ^a   Verrier, Isabelle ^a   Veillas, Colette ^a   Jacquot, Maxime ^a  

^a UNIVERSITÉ JEAN MONNET   (France)

Author keywords

Aspherical surfaces; Dispersion measurements; Optical profilometry; White light interferometry

Indexed keywords

ASPHERICAL SURFACES; DISPERSION MEASUREMENTS; OPTICAL PROFILOMETRY; WHITE LIGHT INTERFEROMETRY;

ASPHERICS; DATA PROCESSING; DEFORMATION; GRADIENT INDEX OPTICS; INTERFEROMETRY; LENSES; MIRRORS; PARAMETER ESTIMATION; PROBLEM SOLVING; SPECTROSCOPIC ANALYSIS; WAVEFRONTS;

OPTICAL SYSTEMS;

EID: 1942510443     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.513400     Document Type: Conference Paper

References (8)

1. J. Calatroni, A. Guerrero, C. Sainz, R. Escalona, Optical implementation of frequency domain analysis for white light interferometry, Universidad Simon Bolivar, Caracas, Venezuela, 1995.
2. P. Sandoz, G. Tribillon, H. Perrin, High-resolution profilometry by using phase calculation algorithms for spectroscopic analysis of white-light interferograms, Université de Franche-Comté, France, 1995.
3. D.N. Wang, K.T.V. Grattan, A.W. Palmer, Dispersion effect analysis with multiwavelength combination sources in optical sensor applications, City University, London, UK, 1995.
4. C. Dorrer, N. Belabas, J.P. Likforman, M. Joffre, Experimental implementation of Fourier-transform spectral interferometry and its application to the study of spectrometers, E.N.S des Techniques Avancées - Ecole Polytechnique - C.N.R.S, France, 2000.
5. J. Calatroni, C. Sainz, R. Escalona, Double phase modulation in the hybrid spatial-chromatic domain as a refractometry tool, Universidad Simon Bolivar, Caracas, Venezuela, 2000.
6. P. Hublina, White-light spectral interferometry with uncompensated Michelson interferometer and the group refractive index dispersion in fused silica, Silesian University at Opava, Czech Republic, 2001.
7. P. Hublina, White-light spectral interferometry to measure intermodal dispersion in two-mode elliptical-core optical fibres, Silesian University at Opava, Czech Republic, 2003.
8. J. Calatroni, C. Sainz, R. Escalona, The stationary phase in spectrally resolved white light interferometry as a refractometry tool, Universidad Simon Bolivar, Caracas, Venezuela, 2003.