Investigation of structural phase transition in polycrystalline SrTiO 3 thin films by Raman spectroscopy

Solid State Communications

Volumn 130, Issue 9, 2004, Pages 577-580

  Du, Y L ^a   Chen, G ^a   Zhang, M S ^b  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

A. Thin films; B. Laser processing; D. Phase transitions; D. Phonons

Indexed keywords

ABSORPTION; GRAIN BOUNDARIES; PHASE TRANSITIONS; PHONONS; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; STRONTIUM COMPOUNDS; THERMAL EFFECTS;

LASER PROCESSING; POLAR MICROREGIONS; STRUCTURAL DISTORTION;

THIN FILMS;

EID: 1942504038     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.03.039     Document Type: Article

References (23)

1. Muller K.A., Burkard H. Phys. Rev. B. 19:1979;3593.
2. Li H., Si W., West A.D., Xi X.X. Appl. Phys. Lett. 73:1998;464.
3. Li H., Si W., West A.D., Xi X.X. Appl. Phys. Lett. 73:1998;190.
4. Chen A., Cross L.E., Yu Z., Guo R., Bhalla A.S., Hao J.H. Appl. Phys. Lett. 78:2001;2754.
5. Treece R.E., Thompson J.B., Mueller C.H., Rivkin T., Cromar M.W. IEEE Trans. Appl. Supercond. 7:1997;2363.
6. Galt D., Price J., Beall J.A., Ono R.H. Appl. Phys. Lett. 63:1993;3078.
7. Fuchs D., Schneider C.W., Schneider R., Rietschel H. J. Appl. Phys. 85:1999;7362.
8. Sirenko A.A., Bernhard C., Golnik A., Clark A.M., Hao J., Si W., Xi X.X. Nature. 404:2000;373.
9. Sirenko A.A., Akimov I.A., Fox J.R., Clark A.M., Li H., Si W., Xi X.X. Phys. Rev. Lett. 82:1999;4500.
10. Akimov I.A., Sirenko A.A., Clark A.M., Hao J., Xi X. Phys. Rev. Lett. 84:2000;4625.
11. Fleury P.A., Scott J.F., Worlock J.M. Phys. Rev. Lett. 21:1968;16.
12. Pertsev N.A., Tagantsev A.K., Setter N. Phys. Rev. B. 61:2000;R825.
13. Petzelt J., Ostapchuk T., Gregora I., Rychetsky I., Hoffmann-Eifert S., Pronin A.V., Yuzyuk Y., , et al. Phys. Rev. B. 64:2001;184111.
14. Du Y., Zhang M., Wu J., Kang L., Yang S., Wu P., Yin Z. Appl. Phys. A. 76:2003;1105.
15. Nilsen W.G., Skinner J.G. J. Chem. Phys. 48:1968;2240.
16. Denisov V.N., Mavrin B.N., Podobedov V.B. Phys. Rep. 151:1987;1.
17. Fleury P.A., Worlock J.M. Phys. Rev. 174:1968;613.
18. Uwe H., Yamaguchi H., Sakudo T. Ferroelectrics. 96:1989;123.
19. Mishra S.K., Ranjan R., Pandey D., Ouillon R., Pinan-Lucarre J.P., Ranson P., Pruzan P. Phys. Rev. B. 64:2001;092302.
20. Chang W., Kirchoefer S.W., Pond J.M., Horwitz J.S., Sengupta L. J. Appl. Phys. 92:2002;1528.
21. Manlief S.K., Fan H.Y. Phys. Rev. B. 5:1972;4046.
22. Toulouse J., DiAntonio P., Vugmeister B.E., Wang X.M., Knauss L.A. Phys. Rev. Lett. 68:1992;232.
23. Uwe H., Sakudo T. Phys. Rev. B. 13:1976;271.