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Volumn 5250, Issue , 2004, Pages 519-527

Ion Assisted Deposition Processes for Precision and Laser Optics

Author keywords

Cold cathode ion source; Ion assisted deposition (IAD); Optical broadband monitoring; Optical coatings; Optical quality; Thermal shift

Indexed keywords

CATHODES; ION BEAM ASSISTED DEPOSITION; ION SOURCES; OPTICAL COATINGS; PHYSICAL VAPOR DEPOSITION; SILICA; TANTALUM COMPOUNDS; THERMODYNAMIC STABILITY; THICKNESS MEASUREMENT; THIN FILMS; TITANIUM DIOXIDE;

EID: 1942489708     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.514811     Document Type: Conference Paper
Times cited : (7)

References (13)
  • 1
    • 0344931863 scopus 로고    scopus 로고
    • Comparison of Free-running vs. Q-switched Er:YAG Laser Photorefractive Keratectomy (Scanning Mode) in Swine Eyes
    • J. Kampmeier, S. Schäfer, G. E. Lang, G. K. Lang, Comparison of Free-running vs. Q-switched Er:YAG Laser Photorefractive Keratectomy (Scanning Mode) in Swine Eyes, Journal of Refractive Surgery, 15, pp. 563-571, 1999
    • (1999) Journal of Refractive Surgery , vol.15 , pp. 563-571
    • Kampmeier, J.1    Schäfer, S.2    Lang, G.E.3    Lang, G.K.4
  • 3
    • 0033681988 scopus 로고    scopus 로고
    • High-average-power free-electron lasers: A new laser source for materials processing
    • M. D. Shinn, High-average-power free-electron lasers: A new laser source for materials processing, Proc. SPIE, 4065, pp.434-40, 2000
    • (2000) Proc. SPIE , vol.4065 , pp. 434-440
    • Shinn, M.D.1
  • 4
    • 1942528923 scopus 로고    scopus 로고
    • Laser Processing of Materials Comes of Age with Tunable, Ultrashort-Pulse Infrared Lasers
    • American Institute of Physics, Williamsburg
    • R. Haglund, D. Bubb, D. Ermer, J. Horwitz, B. Ivanov, M. Papantonakis, Laser Processing of Materials Comes of Age with Tunable, Ultrashort-Pulse Infrared Lasers, American Institute of Physics, Industrial Physics Forum: New Tools for New Materials, Williamsburg, http://www.aip.org/aip/corporate/2002/ haglund_talk.pdf, 2002
    • (2002) Industrial Physics Forum: New Tools for New Materials
    • Haglund, R.1    Bubb, D.2    Ermer, D.3    Horwitz, J.4    Ivanov, B.5    Papantonakis, M.6
  • 6
    • 17144463333 scopus 로고    scopus 로고
    • Characterization of Laser Components for High-Power Ho:YAG Lasers
    • T. Groß, F. Dreschau, D. Ristau, M. Adamik, and P. Fuhrberg, Characterization of Laser Components for High-Power Ho:YAG Lasers, Proc. SPIE, 3244, pp. 111-117, 1998
    • (1998) Proc. SPIE , vol.3244 , pp. 111-117
    • Groß, T.1    Dreschau, F.2    Ristau, D.3    Adamik, M.4    Fuhrberg, P.5
  • 7
    • 1942497083 scopus 로고    scopus 로고
    • Characterization of a Plasma Ion Source and of Ion Assisted Deposited Optical Thin Films
    • D. E. Morton, O. F. Farsakoglu, Characterization of a Plasma Ion Source and of Ion Assisted Deposited Optical Thin Films, Denton Technical Paper, 2000
    • (2000) Denton Technical Paper
    • Morton, D.E.1    Farsakoglu, O.F.2
  • 9
    • 1942497086 scopus 로고    scopus 로고
    • 2 Thin-films
    • Optical Society of America, Banff, Canada
    • 2 Thin-films, Optical Society of America, OIC 2001, Banff, Canada, 2001
    • (2001) OIC 2001
    • Morton, D.E.1    Jensen, T.R.2
  • 11
    • 0029428894 scopus 로고
    • Improvements in Gridless Ion Source Performance
    • R. R. Willey, Improvements in Gridless Ion Source Performance, Proc. Soc. Vac. Coaters, 38, pp. 232-236, 1995
    • (1995) Proc. Soc. Vac. Coaters , vol.38 , pp. 232-236
    • Willey, R.R.1
  • 12
    • 0034542571 scopus 로고    scopus 로고
    • Rapid Prototyping of Optical Thin Film Filters
    • K. Starke, T. Groß, M. Lappschies, and D. Ristau, Rapid Prototyping of Optical Thin Film Filters, Proc. SPIE, 4094, pp. 83-92, 2000
    • (2000) Proc. SPIE , vol.4094 , pp. 83-92
    • Starke, K.1    Groß, T.2    Lappschies, M.3    Ristau, D.4
  • 13
    • 79960261569 scopus 로고    scopus 로고
    • Systematic Errors in Broadband Optical Monitoring
    • Optical Interference Coatings
    • T. Groß, M. Lappschies, K. Starke, and D. Ristau, Systematic Errors in Broadband Optical Monitoring, Optical Interference Coatings, OSA Technical Digest, ME4, 2001
    • (2001) OSA Technical Digest , vol.ME4
    • Groß, T.1    Lappschies, M.2    Starke, K.3    Ristau, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.