Uniformity analysis and design optimization of multi-layer thin film filter used in fiber optics communication system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5250, Issue , 2004, Pages 691-696

  Yang, Minghong ^a,b   Liu, Jinsong ^a   Chen, Qingming ^a   Zhang, Bo ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

Optical thin film; Robust design; Thickness uniformity

Indexed keywords

EVAPORATION; FIBER OPTICS; FUNCTIONS; MATHEMATICAL MODELS; OPTICAL COMMUNICATION; OPTICAL DESIGN; OPTIMIZATION; WAVE FILTERS;

OPTICAL THIN FILMS; ROBUST DESIGN; THICKNESS UNIFORMITY;

THIN FILMS;

EID: 1942489641     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.531887     Document Type: Conference Paper

References (6)

1. A.Musset, I.C.Stevenson, "Thickness Distribution of Evaporated films" Optical thin films and applications, SPIE Vol. 1270, (1990)
2. Ian C. Stevenson, "Optimizing source location for control of thickness uniformity" Solid Thin Films 35, 214-217 (1998)
3. A. Zheng, J.S.Seeley, G.J.Hawkins: "Design of narrowband filters in the infrared region"; Infrared phys. 31, 237-244, 1991
4. C. Jacobs: "Dielectric square bandpass design", Appl. Opt. 20 1039-1042, 1981
5. K. Mitsugi, K. Izumi: "Design method of optical bandpass filters"; Jour. of Lightwave Tech. 15, 1720-1727, 1997
6. H.A.Macleod, Thin-Film Optical Filters, 164-187, 2nd Ed. New Youk. 1986