Worst case reliability prediction based on a prior estimate of residual defects

Proceedings - International Symposium on Software Reliability Engineering, ISSRE

Volumn 2002-January, Issue , 2002, Pages 295-303

  Bishop, Peter G ^a   Bloomfield, Robin E ^a  

^a Adelard and Centre for Software Reliability   (United States)

Author keywords

Computer aided software engineering; Reliability engineering; Reliability theory; Software reliability; Software testing

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; DEFECTS; PROBABILITY; RELIABILITY; RELIABILITY THEORY; SOFTWARE ENGINEERING; SOFTWARE TESTING;

HIGH PROBABILITY; LOW PROBABILITY; PRIOR ESTIMATES; RELIABILITY ENGINEERING; RELIABILITY FUNCTIONS; RELIABILITY MODEL; RELIABILITY PREDICTION; RESIDUAL DEFECTS;

SOFTWARE RELIABILITY;

EID: 1942475792     PISSN: 10719458     EISSN: None     Source Type: Journal    
DOI: 10.1109/ISSRE.2002.1173274     Document Type: Article

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