An X-ray Compton scatter method for density measurement at a point within an object

Applied Radiation and Isotopes

Volumn 60, Issue 6, 2004, Pages 805-814

  Achmad, Balza ^a,b   Hussein, Esam M A ^a  

^a UNIVERSITY OF NEW BRUNSWICK   (Canada)

^b GADJAH MADA UNIVERSITY   (Indonesia)

Author keywords

06.30.Dr; 83.85.Hf; Compton scattering; Density measurement; X rays

Indexed keywords

CARRIER CONCENTRATION; DETECTORS; PHOTONS; X RAYS;

MULTIPLE-DETECTOR SCATTERING; X-RAY PHOTONS;

RADIOISOTOPES;

ANALYTIC METHOD; ARTICLE; COMPTON EFFECT; DENSITY; ELECTRON; IMAGING SYSTEM; MATHEMATICAL COMPUTING; PHOTON; PRIORITY JOURNAL; RADIATION DETECTION; RADIATION ENERGY; RADIATION SCATTERING;

EID: 1942468911     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apradiso.2003.12.005     Document Type: Article

References (12)

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9. Hussein, E., Achmad, B., 2003. Density measurement at a point within an object. Patent No. 6,563,906 B2, United States Patent & Trademark Office.
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