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Volumn 89, Issue 4, 2004, Pages 492-497
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Tugtupite: High-temperature structures obtained from in situ synchrotron diffraction and Rietveld refinements
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
BOND LENGTH;
DIFFRACTION;
EXPANSION;
GEOMETRY;
RIETVELD REFINEMENT;
SILICATE MINERALS;
SODIUM CHLORIDE;
X RAY POWDER DIFFRACTION;
X RAYS;
HIGH RATE;
HIGH-TEMPERATURE STRUCTURE;
IN-SITU SYNCHROTRONS;
LARGE DISPLACEMENTS;
SIX-MEMBERED RINGS;
STRUCTURAL BEHAVIORS;
UNIT CELL PARAMETERS;
VOLUME CHANGE;
SODIUM;
CRYSTAL STRUCTURE;
MINERALOGY;
RIETVELD ANALYSIS;
TEMPERATURE EFFECT;
TUGTUPITE;
X-RAY DIFFRACTION;
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EID: 1942467063
PISSN: 0003004X
EISSN: None
Source Type: Journal
DOI: 10.2138/am-2004-0403 Document Type: Article |
Times cited : (8)
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References (10)
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