SIMS microanalyses for Au in silicates

American Mineralogist

Volumn 89, Issue 4, 2004, Pages 498-504

  Hervig, Richard L ^a   Mazdab, Frank K ^a   Danielson, Lisa ^a   Sharp, Thomas G ^a   Hamed, A ^a   Williams, Peter ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; GOLD COMPOUNDS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICATES;

CHARGE NEUTRALIZATION; DETECTION LEVELS; ELECTRON FLOOD GUN; ENERGY FILTERING; HIGH SENSITIVITY; MAGNETIC SECTORS; MASS RESOLUTION; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY;

IONS;

GOLD; MINERALOGY; SILICATE MINERAL; SPECTROMETRY;

EID: 1942467060     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2004-0404     Document Type: Article

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