Raman investigations of semiconductors with defects

Uspekhi Fizicheskikh Nauk

Volumn 174, Issue 3, 2004, Pages 259-285

  Falkovskij, L A ^a  

^a NONE

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EID: 1942425945     PISSN: 00421294     EISSN: None     Source Type: Journal    
DOI: 10.3367/ufnr.0174.200403b.0259     Document Type: Article

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