Monitoring the last two (AR) layers in narrow bandpass filters

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5250, Issue , 2004, Pages 400-405

  Willey, Ronald R ^a  

^a Willey Optical   (United States)

Author keywords

Error correction; Film thickness monitors; Monitoring; Narrow band filter coatings

Indexed keywords

FILM THICKNESS MONITORS; NARROW BAND FILTER COATINGS;

BANDPASS FILTERS; COMPUTER SIMULATION; DENSE WAVELENGTH DIVISION MULTIPLEXING; ERROR CORRECTION; LIGHT TRANSMISSION; MONITORING; OPTICAL COMMUNICATION; SPURIOUS SIGNAL NOISE;

ANTIREFLECTION COATINGS;

EID: 1942425593     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.510715     Document Type: Conference Paper

References (7)

1. R. R. Willey, "Search for the Cause of Asymmetric Results of Monitoring Errors in DWDM Filters and the Benefits of Corrections in the Last Two Layers,"," Proc. Soc. Vac. Coaters 46, TBD, 2003.
2. R. R. Willey, "Achieving Narrow Bandpass Filters Which Meet the Performance Required for DWDM," Thin Solid Films, 398-399, 1, 2001.
3. R. R. Willey, "Simulation of errors in monitoring narrow bandpass filters," Appl. Opt. 41, 3193-3195, 2002.
4. R. R. Willey, "Estimating the Properties of DWDM Filters Before Designing and Their Error Sensitivity and Compensation Effects in Production," Proc. Soc. Vac. Coaters 44, 262, 2001.
5. R. R. Willey, "Application of a refined error model of turning point monitoring to the simulation of narrow bandpass filter production,"," Proc. Soc. Vac. Coaters 45, 295, 2002.
6. nd Ed., page 8 and following (Marcel Dekker, Inc., 2002).
7. FilmStar Design Program, FTG Software Associates, P. O. Box 579, Princeton, NJ 08542