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Volumn 5165, Issue , 2004, Pages 469-481

Iridium Optical Constants for the Chandra X-Ray Observatory from Reflectance Measurements of 0.05-12 keV

Author keywords

Chandra X ray Observatory; Grazing incidence; Iridium; Optical constants; Reflectance; X ray mirrors

Indexed keywords

GRAZING INCIDENCE; OPTICAL CONSTANTS; X-RAY MIRRORS;

EID: 1942423080     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.506132     Document Type: Conference Paper
Times cited : (17)

References (8)
  • 1
    • 0032297507 scopus 로고    scopus 로고
    • Modeling of synchrotron reflectance calibrations of AXAF iridium-coated witness mirrors over 2-12 keV
    • X-ray Optics, Instruments, and Missions, ed. by R.B. Hoover and A.B.C. Walker II
    • D.E. Graessle, R.L. Blake, A.J. Burek, S.E. Dyson, J.J. Fitch, D.A. Schwartz, and R. Soufli, "Modeling of synchrotron reflectance calibrations of AXAF iridium-coated witness mirrors over 2-12 keV," in X-ray Optics, Instruments, and Missions, ed. by R.B. Hoover and A.B.C. Walker II, Proc. SPIE, 3444, pp. 140-159, 1998.
    • (1998) Proc. SPIE , vol.3444 , pp. 140-159
    • Graessle, D.E.1    Blake, R.L.2    Burek, A.J.3    Dyson, S.E.4    Fitch, J.J.5    Schwartz, D.A.6    Soufli, R.7
  • 2
    • 0001634592 scopus 로고    scopus 로고
    • IMD-software for modeling the optical properties of multilayer films
    • The IMD program
    • D. L. Windt, "IMD-software for modeling the optical properties of multilayer films," Computers Phys. 12, 360-370, 1998. The IMD program is available at http://www.cletus.phvs.columbia.edu/~windt/imd/.
    • (1998) Computers Phys. , vol.12 , pp. 360-370
    • Windt, D.L.1
  • 3
    • 0000515073 scopus 로고
    • Caracterisation des surfaces par reflexion rasante de rayons X. Application a l'etude du polissage de quelques verres silicates
    • L. Nevot and P. Croce, "Caracterisation des surfaces par reflexion rasante de rayons X. Application a l'etude du polissage de quelques verres silicates," Rev. Phys. Appl. 15, pp. 761-779, 1980.
    • (1980) Rev. Phys. Appl. , vol.15 , pp. 761-779
    • Nevot, L.1    Croce, P.2
  • 5
    • 0004932883 scopus 로고
    • X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E=50-30,000 eV, Z=1-92
    • B.L. Henke, E.M. Gullikson, and J.C. Davis, "X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30,000 eV, Z=1-92," in Atomic Data and Nuclear Data Tables 54(2), p. 181, 1993. See also the Web page http://www-cxro.lbl.gov/optical constants/.
    • (1993) Atomic Data and Nuclear Data Tables , vol.54 , Issue.2 , pp. 181
    • Henke, B.L.1    Gullikson, E.M.2    Davis, J.C.3
  • 6
    • 85086353720 scopus 로고    scopus 로고
    • The development of Beamline U3A for AXAF synchrotron reflectivity calibrations
    • X-ray Optics, Instruments, and Missions, ed. by R.B. Hoover and A.B.C. Walker II
    • A.J. Burek, R.L. Blake, J.P. Cobuzzi, J.J. Fitch, R. Francoeur, D.E. Graessle, R.H. Ingram, E.S. Sullivan, and J.B. Sweeney, "The development of Beamline U3A for AXAF synchrotron reflectivity calibrations," in X-ray Optics, Instruments, and Missions, ed. by R.B. Hoover and A.B.C. Walker II, Proc. SPIE, 3444, pp. 140-159, 1998.
    • (1998) Proc. SPIE , vol.3444 , pp. 140-159
    • Burek, A.J.1    Blake, R.L.2    Cobuzzi, J.P.3    Fitch, J.J.4    Francoeur, R.5    Graessle, D.E.6    Ingram, R.H.7    Sullivan, E.S.8    Sweeney, J.B.9
  • 8
    • 0031310652 scopus 로고    scopus 로고
    • Beamline for metrology of X-ray/EUV optics at the Advanced Light Source
    • J.H. Underwood, E.M. Gullikson, M. Koike, and P.J. Batson, "Beamline for metrology of X-ray/EUV optics at the Advanced Light Source," Proc. SPIE, 3113, pp. 214-221, 1997.
    • (1997) Proc. SPIE , vol.3113 , pp. 214-221
    • Underwood, J.H.1    Gullikson, E.M.2    Koike, M.3    Batson, P.J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.