Provenance analysis by single-quartz-grain SEM-CL/optical microscopy

Journal of Sedimentary Research

Volumn 75, Issue 3, 2005, Pages 492-500

  Bernet, Matthias ^a,b   Bassett, Kari ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

^b UNIVERSITÉ GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MICROCRACKS; MICROCRYSTALS; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; TEXTURES;

DIAGENETICS; ITS APPLICATIONS; MICROCRYSTALLINITY; MICROSCOPY TECHNIQUE; PROVENANCE ANALYSIS; QUARTZ GRAINS; SOUTH ISLAND; TEXTURAL FEATURE;

QUARTZ;

CATHODOLUMINESCENCE; PROVENANCE; QUARTZ; SCANNING ELECTRON MICROSCOPY;

EID: 19344369623     PISSN: 15271404     EISSN: None     Source Type: Journal    
DOI: 10.2110/jsr.2005.038     Document Type: Article

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