Condition monitoring using a latent process model with an application to sheet metal stamping processes

Journal of Manufacturing Science and Engineering

Volumn 127, Issue 2, 2005, Pages 376-385

  Li, Xiaoli ^a   Du, R ^b  

^a YANSHAN UNIVERSITY   (China)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; CONFORMAL MAPPING; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; NEURAL NETWORKS; PRINCIPAL COMPONENT ANALYSIS; REGRESSION ANALYSIS; SENSORS; SHEET METAL; STAMPING; TESTING;

EXPECTATION MAXIMIZATION (EM) ALGORITHM; GAUSSIAN PROCESSES; GENERATIVE TOPOGRAPHIC MAPPING (GTM); LATENT PROCESS MODELS;

CONDITION MONITORING;

EID: 19344367693     PISSN: 10871357     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1870015     Document Type: Article

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