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Volumn 85, Issue 21, 2004, Pages 4893-4895

Hydrogen-induced metallization of a preoxidized 3C-SiC (100) 3×2 surface

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; FERMI LEVEL; HYDROGEN; METALLIZING; PASSIVATION; PEROXIDES; PHOTOEMISSION; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS; SYNCHROTRON RADIATION;

EID: 19144367990     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1827938     Document Type: Article
Times cited : (17)

References (30)
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  • 8
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    • Silicon Carbide Electronic Devices and Materials, MRS Bull. 0883-7694 22, March (1997);
    • (1997) MRS Bull. , vol.22
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    • 19144365297 scopus 로고    scopus 로고
    • IEEE trans. electron devices
    • IEEE Trans. Electron Devices, special issue on Silicon Carbide Electronic Devices, 46 (1999).
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    • M. Wilson, Phys. Today 0031-9228 56, 18 (2003);
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    • Wilson, M.1
  • 16
    • 19144364690 scopus 로고    scopus 로고
    • Ph.D. thesis No. 7247, Universit́ de Paris-SudOrsay, 9 July
    • M. D'angelo, Ph.D. thesis No. 7247, Universit́ de Paris-SudOrsay, 9 July 2003;
    • (2003)
    • D'Angelo, M.1
  • 20
    • 0001015352 scopus 로고    scopus 로고
    • 0163-1829 10.1103/PhysRevB.60.2495
    • W. Lu, P. Krüger, and J. Pollman, Phys. Rev. B 0163-1829 10.1103/PhysRevB.60.2495 60, 2495 (1999);
    • (1999) Phys. Rev. B , vol.60 , pp. 2495
    • Lu, W.1    Krüger, P.2    Pollman, J.3
  • 28
    • 0003568127 scopus 로고
    • edited by P. T.Landsberg (Elsevier, Amsterdam)
    • L. Brillson, Handbook on Semiconductors, 2nd ed., edited by, P. T. Landsberg, (Elsevier, Amsterdam, 1992), Vol. 1, Chap., and references therein.
    • (1992) Handbook on Semiconductors, 2nd Ed. , vol.1
    • Brillson, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.