Measuring near the diffraction-limited wavefront of semiconductor laser beam

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 32, Issue 4, 2005, Pages 519-522

  Liu, Hong Zhan ^a,b   Liu, Li Ren ^a   Xu, Rong Wei ^a   Luan, Zhu ^a   Teng, Shu Yun ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Diffraction limited; Divergence angle; Double shearing interferometer; Optical communication

Indexed keywords

INTERFEROMETERS; OPTICAL COMMUNICATION; SATELLITE COMMUNICATION SYSTEMS; SEMICONDUCTOR LASERS; WAVEFRONTS;

DIVERGENCE ANGLE; DOUBLE-SHEARING INTERFEROMETERS; FRAUNHOFER DIFFRACTION; LASER BEAM QUALITY; WAVEFRONT MEASUREMENT;

LASER BEAMS;

EID: 19044394680     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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