Quantitative roughness of sputtered Fe-Cr superlattices

European Physical Journal B

Volumn 30, Issue 2, 2002, Pages 17-23

  Gomez M E ^a,c   Santamaria, J ^a,d   Cyrille, M C ^b,e   Nelson, E C ^b   Krishnan, K M ^b   Schuller, I K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSIDAD DEL VALLE   (Colombia)

^d UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^e IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

61.10.Eq X ray scattering; 68.35.Ct Interface structure and roughness; 68.37.Lp Transmission electron microscopy (TEM); 68.65.Cd Superlattices

Indexed keywords

EID: 19044364035     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2002-00353-0     Document Type: Article

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