Model-robust process optimization using Bayesian model averaging

Technometrics

Volumn 47, Issue 2, 2005, Pages 152-163

  Rajagopal, Ramkumar ^a   Del Castillo, Enrique ^a  

^a The Center for Nanotechnology Education and Utilization   (United States)

Author keywords

Bayesian model averaging; Predictive density; Response surface methodology

Indexed keywords

BAYESIAN MODEL AVERAGING; MODEL POSTERIORS; PREDICTIVE DENSITY; RESPONSE SURFACE METHODOLOGY;

MATHEMATICAL MODELS; OPTIMIZATION; PREDICTIVE CONTROL SYSTEMS; PROBLEM SOLVING; PROCESS CONTROL; ROBUSTNESS (CONTROL SYSTEMS);

PROCESS ENGINEERING;

EID: 18944394139     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017005000000120     Document Type: Article

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