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Volumn 47, Issue 5, 2005, Pages 280-284
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New NDE perspectives with magnetoresistance array technologies - From research to industrial applications
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Author keywords
[No Author keywords available]
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Indexed keywords
ARRAYS;
DEFECTS;
DIAMAGNETIC MATERIALS;
FERROMAGNETIC MATERIALS;
GIANT MAGNETORESISTANCE;
INSPECTION;
MAGNETIC DEVICES;
MAGNETIC FIELD MEASUREMENT;
MAGNETIC LEAKAGE;
PROBES;
SENSORS;
SPURIOUS SIGNAL NOISE;
ARRAY SENSOR;
DEFECTS DETECTION;
MAGNETIC SENSOR;
MAGNETORESISTANCE ARRAY;
EDDY CURRENT TESTING;
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EID: 18944385837
PISSN: 13542575
EISSN: None
Source Type: Journal
DOI: 10.1784/insi.47.5.280.65047 Document Type: Article |
Times cited : (12)
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References (5)
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