A Bayesian sequential look at u-control charts

Technometrics

Volumn 47, Issue 2, 2005, Pages 142-151

  Bayarri, M J ^a   Garcia Donato G ^b  

^a UNIVERSITY OF VALENCIA   (Spain)

^b UNIVERSITY OF CASTILLA LA MANCHA   (Spain)

Author keywords

Empirical Bayes approach; Objective Bayesian methods; Overdispersion; Predictive distributions; Statistical process control

Indexed keywords

CONTROL THEORY; MATHEMATICAL MODELS; PROBABILITY; PROCESS CONTROL; STATISTICS;

BAYESIAN METHODS; EMPIRICAL BAYES APPROACH; PREDICTIVE DISTRIBUTIONS;

PROCESS ENGINEERING;

EID: 18944371338     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017005000000085     Document Type: Article

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