Sample size and number of failure requirements for demonstration tests with log-location-scale distributions and failure censoring

Technometrics

Volumn 47, Issue 2, 2005, Pages 182-190

  McKane, Scott W ^a   Escobar, Luis A ^b   Meeker, William Q ^c  

^a 3M COMPANY   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

^c Department of Statistics Center for Statistics and Applications in Forensic Evidence Iowa State University 2438 Osborn Dr Ames   (United States)

Author keywords

Maximum likelihood; Reliability; Simulation

Indexed keywords

FAILURE PROBABILITIES; MAXIMUM LIKELIHOOD; TOLERANCE BOUNDS;

COMPUTER SIMULATION; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PROBABILITY; STATISTICS; TARGETS;

RELIABILITY;

EID: 18944361877     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017005000000030     Document Type: Article

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