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Volumn 338, Issue , 2000, Pages

Metal-contact enhanced incorporation of deuterium in 4H- and 6H-SiC

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; DEUTERIUM; DIFFUSION IN SOLIDS; GOLD; HEAT TREATMENT; HYDROGEN; INTERFACES (MATERIALS); NICKEL; PLATINUM; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON COMPOUNDS; TITANIUM;

EID: 18844482865     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (1)

References (12)
  • 9
    • 0000920530 scopus 로고
    • edited by G.L. Harris, emis data review series INSPEC, London and references therein
    • R. Kaplan and V.M. Bermudez, in Properties of Silicon Carbide, edited by G.L. Harris, emis data review series No. 13 (INSPEC, London 1995), p. 101, and references therein.
    • (1995) Properties of Silicon Carbide , Issue.13 , pp. 101
    • Kaplan, R.1    Bermudez, V.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.