In situ measurement of stresses in alumina scales by high temperature X-ray diffraction

Materials Science Forum

Volumn 369-372, Issue I, 2001, Pages 547-554

  Kolarik, V ^a   Fietzek, H ^a   Juez Lorenzo, M ^a   Gross M ^a  

^a FRAUNHOFER INSTITUTE FOR CHEMICAL TECHNOLOGY ICT   (Germany)

Author keywords

Alumina scales; FeCrAl based alloys; In situ X ray diffraction; Mechanical stresses

Indexed keywords

COMPRESSIVE STRESS; COOLING; GROWTH (MATERIALS); HIGH TEMPERATURE EFFECTS; MEASUREMENT ERRORS; OXIDATION; RESIDUAL STRESSES; X RAY DIFFRACTION ANALYSIS;

ALUMINA SCALES; HIGH TEMPERATURE X RAY DIFFRACTION; PARALLEL BEAM GEOMETRY;

ALUMINA;

EID: 18844475831     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.369-372.547     Document Type: Conference Paper

References (17)