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Volumn 431, Issue 1, 1999, Pages 285-293
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Characterization of undulator radiation at MAXII using a soft X-ray fluorescence spectrometer
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION GRATINGS;
ELECTRON BEAMS;
PHOTONS;
STORAGE RINGS;
X RAY SPECTROMETERS;
ELECTRON BEAM COUPLING;
GRAZING INCIDENCE GRATING SPECTROMETER;
LANDAU CAVITIES;
LIGHT DETECTION;
UNDULATOR RADIATION;
X RAY FLUORESCENCE SPECTROMETER;
SYNCHROTRON RADIATION;
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EID: 18844467268
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00182-5 Document Type: Article |
Times cited : (4)
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References (11)
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