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Volumn 431, Issue 1, 1999, Pages 285-293

Characterization of undulator radiation at MAXII using a soft X-ray fluorescence spectrometer

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELECTRON BEAMS; PHOTONS; STORAGE RINGS; X RAY SPECTROMETERS;

EID: 18844467268     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00182-5     Document Type: Article
Times cited : (4)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.