Extension of the Hammerstein model for power amplifier applications

63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization

Volumn , Issue , 2004, Pages 131-137

  Isaksson, Magnus ^a   Wisell, David ^a,b  

^a UNIVERSITY OF GÄVLE   (Sweden)

^b ERICSSON RESEARCH   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; DATA STORAGE EQUIPMENT; DIGITAL FILTERS; ELECTRIC DISTORTION; FUNCTIONS; MATHEMATICAL MODELS; MODULATION; NONLINEAR SYSTEMS;

BLOCK DIAGRAMS; DIGITAL MODULATION; HAMMERSTEIN MODEL; LINEAR FILTERS; NON-LINEAR FUNCTIONS;

POWER AMPLIFIERS;

EID: 18844461626     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. O. Andersen, P. Malmlöf and D. Wisell, "Nonlinear Characterization of Multiple Carrier Power Amplifiers," presented at ARFTG 56 2000, Boulder, CO, 2000.
2. W. Bösch and G. Giuliani, "Measurement and Simulation of Memory Effects in Predistortion Linearizers," IEEE Trans. on Microwave Theory and Techniques, vol 37, pp. 1885-1890, 1989.
3. M. Heutmaker, J. Welch and E. Wu, "Using Digital Modulation to Measure and Model RF Amplifier Distortion," Applied Microwave & Wireless, vol. 9, pp. 34-39, 1997.
4. T. Rahkonen and J. Vuolevi, "Extraction of a Nonlinear AC FET ModelUsing Small-Signal S-Parameters," IEEE Trans. on Microwave Theory and Techniques, vol. 50, pp. 1311-1315, 2002.
5. N. Le Gallou, E. Ngoya, H. Buret, D. Barataud, J. Nebus, "An Improved Behavioral Modeling Technique for High Power Amplifiers with Memory," presented at Microwave Theory and Techniques, 2001.
6. M. Heutmaker, J. Welch and E. Wu, "Envelope Distortion Models with Memory Improve some Amplifier Spectral Regrowth Predictions," Applied Microwave & Wireless, vol. 9, pp. 72-78, 1997.
7. S. Boumaiza and F. M. Ghannouchi, "An Accurate Complex Behavior Test Bed Suitable For 3G Power Amplifiers Characterization," presented at MTT-S 2002, Seattle, 2002.
8. D. Wisell, "A Baseband Time Domain Measurement System for Dynamic Characterisation of Power Amplifiers with High Dynamic Range over Large Bandwidths," presented at IMTC 2003, Vail, Colorado, 2003.
9. A. Moulmrop, "Baseband Time-Domain Waveform Measurement Method,". US patent 6,211,663: The Aerospace Corporation, 2001.
10. S. M. Kay, Fundamentals of Statistical Signal Processing, vol. II. Upper Saddle River, New Jersey: Prentice-Hall, 1998.