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Journal of Applied Physics

Volumn 44, Issue 1, 1973, Pages 527-528

Dielectric breakdown induced by sodium in MOS structures

(1) DiStefano, T H a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18844459799 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1661931 Document Type: Article

Times cited : (54)

References (10)

1
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- Chou, N.J.¹ Eldridge, J.M.²

2
- 0347884395
- (1966) IEEE Trans. Electron Devices , vol.13 , pp. 276
- Yon, E.¹ Ko, W.H.² Kuper, A.D.³

3
- 0000527118
- (1965) J. Appl. Phys. , vol.36 , pp. 1664
- Snow, E.H.¹ Grove, A.S.² Deal, B.E.³ Sah, C.T.⁴

4
- 0000924048
- (1966) IEEE Trans. Electron Devices , vol.13 , pp. 222
- Hofstein, S.R.¹

5
- 0038089518
- (1967) IEEE Trans. Electron Devices , vol.14 , pp. 749
- Hofstein, S.R.¹

6
- 0347590306
- (1966) J. Appl. Phys. , vol.37 , pp. 1491
- Williams, R.¹

7
- 0344181617
- (1971) Appl. Phys. Lett. , vol.19 , pp. 280
- DiStefano, T.H.¹

8
- 36849104409
- (1971) J. Appl. Phys. , vol.42 , pp. 425
- Schlegel, E.S.¹

9
- 0001635735
- (1966) IEEE Trans. Electron Devices , vol.13 , pp. 788
- Klein, N.¹

10
- 84950558899
- (unpublished)
- (1972) presented at the Thirty-Second Annual Conference on Physical Electronics, Albuquerque, N.M.
- DiStefano, T.H.¹ Lewis, J.E.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.