An apparatus to investigate energetic aspects of charge trapping induced by low-energy electron impact at the surface of organic dielectric material

Vide: Science, Technique et Applications

Volumn , Issue 287 SUPPL.1, 1998, Pages 110-119

  Cloutier, P ^a   Bass, A D ^a   Nagesha, K ^a   Sanche, L ^a   Parpal, J L ^b  

^a UNIVERSITY OF SHERBROOKE   (Canada)

^b HYDRO QUÉBEC   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18844450214     PISSN: 12660167     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (22)

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13. Obtained from Oriel Corporation Stratford, CT. USA.
14. From the 71st Edition of CRC Handbook of Chemistry and Physics, edited by D.R. Lide CRC Press, Boca Raton 1990).
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17. K. Nagesha and L. Sanche, to be published.
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22. The existence of very short-lived states at low energies has been demonstrated; M. Allen and L. Andric, J. Chem. Phys., 105, 3559 (1996).