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Volumn 33, Issue 2 I, 2005, Pages 336-337
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Spatially resolved energy analyzer measurements of an ion beam on the low potential side of a current-free double-layer
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Author keywords
Double layer; Energy analyzer; Expanding
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Indexed keywords
ARGON;
ELECTRIC CURRENTS;
IMAGE ANALYSIS;
ION BEAMS;
MAGNETIC FIELD EFFECTS;
PARTICLE BEAM DYNAMICS;
PLASMA SOURCES;
PRESSURE EFFECTS;
CURRENT FREE DOUBLE LAYER;
EXPANDING PLASMA;
ION ACCELERATION;
SPATIALLY RESOLVED ENERGY ANALYZER MEASUREMENTS;
SUPERSONIC ION BEAMS;
PLASMA INTERACTIONS;
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EID: 18844449661
PISSN: 00933813
EISSN: None
Source Type: Journal
DOI: 10.1109/TPS.2005.844958 Document Type: Article |
Times cited : (18)
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References (3)
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