Simultaneous load-pull and real-time infrared thermal imaging of RF/microwave power transistors

63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization

Volumn , Issue , 2004, Pages 13-20

  Sevic, John F ^a   Albright, Grant ^b   Schuerch, Werner ^c   Simpson, Gary M ^a  

^a Maury Microwave   (United States)

^b Quantum Focus Instruments   (United States)

^c Intercontinental Microwave   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIMENSIONS; INFRARED THERMAL IMAGING SYSTEMS; POWER DENSITY; WAVELENGTHS;

ELECTRIC IMPEDANCE; FAILURE ANALYSIS; INFRARED IMAGING; MICROWAVE DEVICES; OPTIMIZATION; PERFORMANCE; TECHNOLOGICAL FORECASTING; THERMAL EFFECTS;

TRANSISTORS;

EID: 18844442275     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Quantum Focus Instruments Corporation (http://quantumfocus.com).
2. Maury Microwave Corporation (http://www.maurymw.com)
3. Intercontinental Microwave Corporation (http://www.icmicrowave.com)
4. Maury Microwave Corporation, ATS Users Guide, v. 3.0, Ontario, CA, 2003.
5. J. Sevic, 'A Sub 1 Ω Load-Pull Quarter-Wave Pre-Matching Network Based On A Two-Tier TRL Calibration," Digest of the Winter 1997 Automatic RF Techniques Group, December, 1997.
6. J. Sevic, 'Theory of High-Power Load-Pull Characterization for RF and Microwave Transistors," in The RF and Microwave and Handbook, CRC Press: Boca Raton, FL, 2001.
7. J.Paviol, E.Kueckels, R.Varanasi, and L. Dunleavy, "PA Load Pull Error Limits using Delta Gt Contours, " Topical Workshop on Power Amplifiers for Wireless Communications, Sept. 8-9, 2003, San Diego, CA