Crystal structure of bis(tributyltin) succinanthranilate, (C4H9)3SnO2CC6H4-2-NHCO(CH2)2CO2Sn(C4H9)3

Zeitschrift fur Kristallographie - New Crystal Structures

Volumn 213, Issue 1-4, 1998, Pages 157-158

  Ng, Seik Weng ^a  

^a UNIVERSITY OF MALAYA   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18844426379     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1524/ncrs.1998.213.14.157     Document Type: Article

References (7)

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2. Enraf-Nonius Delft: CAD4 VAX/PC Fortran System. Operator’s Guide to the Enraf-Nonius CAD4 Diffractometer Hardware, its Software and the Operating System. Enraf-Nonius Delft, Delft, The Netherlands 1988.
3. Hall, S. R., Stewart, J. M. (Eds): Xtal3.0 Reference Manual. Universities of Western Australia, Australia, and Maryland, USA 1990.
4. Johnson, C. K., ORTEP-II. Report ORNL-5138. Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA 1976.
5. North, A. C. T., Phillips, D. C., Mathews, F. S., A semi-empirical method of absorption correction. Acta Crystallogr. A24 (1968) 351-359.
6. Sheldrick, G. M., Phase annealing in SHELXS-90: Direct methods for larger structures. Acta Crystallogr. A46 (1990) 467-473.
7. Sheldrick, G. M., SHELXL-93. Program for the refinement of crystal structures. University of Göttingen, Germany 1993.