Determination of the states of oxidation of metals in thin oxide films by X-ray photoelectron spectroscopy

Journal of Analytical Chemistry

Volumn 60, Issue 5, 2005, Pages 431-435

  Alov, N V ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BINDING ENERGY; CATALYSIS; DOSIMETERS; ION BOMBARDMENT; PHOTOIONIZATION; POLYCRYSTALLINE MATERIALS; SURFACE CLEANING; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY RESOLUTION; PHOTOELECTRON BINDING ENERGIES; THIN OXIDE FILMS;

OXIDATION;

EID: 18844412395     PISSN: 10619348     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10809-005-0114-x     Document Type: Article

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